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- genid67318 identifier "10.1109/EMCEurope57790.2023.10274213" @default.
- genid67318 title "Xue, X., Claeys, T., Pissoort, D. (2022). Application of a Testing-to-Failure Approach to the Susceptibility Assessment of Electronic Systems, Published in: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Electronic ISBN:979-8-3503-2400-6, DOI: 10.1109/EMCEurope57790.2023.10274213, date of presenting: 5th September, Krakow, Poland" @default.
- genid67318 uri 10274213 @default.
- genid67318 type Document @default.